2009年10月EI收录西安工业大学论文名录

   1.Determination of trace nickel in hydrogenated cottonseed oil by pressurized bomb acid digestion and graphite furnace atomic absorption spectrometry detection
Liu, Jianbo1; Zhang, Gai2; Meng, Zuchao3; Qiao, Bo4 Source: JAOCS, Journal of the American Oil Chemists' Society, v 86, n 10, p 967-970, October 2009 Language: English ISSN: 0003021X CODEN: JJASDH Publisher: Springer Verlag Author affiliation: 1.Department of Chemistry, Xianyang Normal University, 712000 Xianyang, Shannxi Province, China 2.School of Materials and Chemical Engineering, Xi'An Technological University, 710032 Xi'an, China 3.College of Chemistry and Chemical Engineering, Xi'An Petroleum University, 710065 Xi'an, China 4.Institute for Hygiene of Ordnance Industry, No.12 Zhangba East Road, 710065 Xi'an, China
   2.System-level design and analysis of MEMS-based micro-fuze resonator
Guo, Rong1; Huang, Dingjin1; Guo, Weiwei1; Shi, Dongchen1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7284, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Optoelectronics Engineering, Xi'an University of Technology, Xi'an 710032, China
   3.Anaysis on chopper's output mode of the extended blackbody radiation calibration system
Yu, Xuna1; Wei, Yu-Hana1; Hu, Tie-Lib2; Shang, Xiao-Yana1; Wu, Ji-Anb2 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Photoelectric Engineering, Xi'an Technological University, Xi'an 710032, China 2.Xi'an Institute of Applied Optics, Xi'an 710065, China
   4.Interferometric measurement method of thin film thickness based on FFT
Gaolong, Shuai1; Junhong, Su1; Lihong, Yang1; Junqi, Xu1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Shaanxi Xi'an 710032
   5.Set of axes compensation and measurement between multitudinous photoelectric instruments under shape changing carrier
Wang, Jinga1; Chen, Wen-Jianb2; Han, Juna1; Yu, Xuna1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China 2.Xi'an Institute of Applied Optics, Xi'an 710065, China
   6.Design of 3D measurement system based on multi-sensor data fusion technique
Zhang, Weiguang1; Han, Jun1; Yu, Xun1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China
   7.Scattering property of rough surface of silicon solar cells
Bai, Lu1, 2; Wu, Zhensen1; Tang, Shuangqing1; Pan, Yongqiang2 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Science, Xidian University, Xi'an 710071, China 2.Xi'an technological university, Xi'an, 710032, China
   8.Adaptive tracking and compensation of laser spot based on ant colony optimization
Yang, Lihong1, 2; Ke, Xizheng1; Bai, Runbing2; Hu, Qidi1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.Faculty of Automation and Information Engineering, Xi'an University of Technology, Xi'an, 710048, China 2.Xi'an Technological University, Xi'an 710032, China
   9.Research on focal length determination technique of laser test system based on Talbot effect
Wu, Ling-Ling1, 2, 3; Zheng, Li4; Wu, Guo-Jun1; Cang, Yu-Ping1, 2; Chen, Liang-Yi1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China 2.Graduate School of the Chinese, Academy of Sciences, Beijing 100039, China 3.Measurement and Control Technology and Instrumentation, School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China 4.Henan Institute of Metrology, Zhengzhou 450008, China
   10.Roughness evolution of fused silica during plasma polishing processes
Liu, Weiguo1; Wang, Dasen2; Hu, Minda1; Wang, Yingnan1; Liang, Haifeng1; Hang, Lingxia1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7282, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.Laboratory of Thin Film Techniques and Optical Test, Xi'an Technological University, Xi'an 710032, China 2.Changchun University of Science and Technology, Changchun 130022, China
   11.Optimization of 3-D topography measurement based on moiré technique
Nie, Liang1; Han, Jun1; Yu, Xun1; Liu, Baoyuan1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Opto-electronics Engineering, Xi'an Institute of Technology, Xi'an, 710032, China
   12.Effect of substrate bias and arc current on AlN films
Liang, Haifeng1; Liu, Hengping1; Zhou, Yang1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7282, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.Key Laboratory of optical measurement and thin film of Shanxi province, Xi'an Technological University, Xi'an, 710032, China    13.Analysis of working range in IR camera measurement
Dong, Wei1; Chen, Jing1; An, Ying1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Opto-electronic Engineering, Xi'an Technological University, Xi'an, 710032, Shaanxi, China
   14.Interfaces roughness cross correlation properties and light scattering of optical thin films
Pan, Yong-Qiang1, 2; Wu, Zhen-Senb2; Hang, Ling-Xiaa1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Photoelectric Engineering, Xi'an Technological University, Xi'an, 710032, China 2.School of science, Xidian University, Xi'an 710071, China
   15.Research of fitting algorithm for coefficients of rotational symmetry aspheric lens
Chen, Zhi-Li1; Guo, Zhong-Da1; Mi, Qian1; Yang, Zhi-Qiang1; Bai, Run-Bin1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.Xi'an Technological University, Xi'an 710032, China
   16.Adaptive algorithm of infrared target enhancement for target recognition of infrared detector
Guo, Jiaa1; Liu, Wei-Guoa1; Gao, Jiao-Bob2; Qin, Wen-Ganga2 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Photoelectric Engineering, Xi'an Technological University, Xi'an 710032, China 2.Xi'an Institute of Applied Optics, Xi'an 710065, China
   17.Laser-induced damage threshold detection for optical thin films and research on damage morphology
Jun-hong, Su1; Lou, Jun1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7283, 2009, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment Language: English ISSN: 0277786X CODEN: PSISDG Conference: 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, November 19, 2008 - November 21, 2008 Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); State Key Laboratory of Optical Technology for Microfabrication; Sichuan Optical Society (SOS) Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, 710032 Xi'an, China

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