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4月

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4月

2011年4月EI收录西安工业大学论文名录

   1.The correction of aberration on measurement based on image Liu, Junqiang1, 2; Gao, Jianming1; Shen, Qingming1 Source: Proceedings - 3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, v 3, p 733-736, 2011, Proceedings - 3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011; ISBN-13: 9780769542966; DOI: 10.1109/ICMTMA.2011.755; Article number: 5721592; Conference: 3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, January 6, 2011 - January 7, 2011; Sponsor: IEEE Instrumentation and Measurement Society; Shanghai University of Engineering Science; City University of Hongkong; Changsha University of Science and Technology; Hunan University of Science and Technology; Publisher: IEEE Computer Society Author affiliation: 1.State Key Laboratory for Manufacturing Systems Engineering, Xi'an Technological University, 710049, China 2.School of Mechanical and Electronics Engineering, Xi'an Technological University, 710049, China
   2. Designing and preparation of tricolor light filter Li, Dangjuan1; Wu, Shenjiang1; Lu, Jinjun1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications; ISSN: 0277786X; ISBN-13: 9780819485687; DOI: 10.1117/12.888211; Article number: 799530; Conference: 7th International Conference on Thin Film Physics and Applications, September 24, 2010 - September 27, 2010; Sponsor: Tongji University, Department of Physics; Tongji Univ., Key Lab. Adv. Microstruct. Mater., Minist. Educ.; Tongji Univ., Key Lab. Spec. Artif. Microstruct. Mater. Technol.; National Natural Science Foundation of China; Science and Technology Commission of Shanghai Municipality; Publisher: SPIE Author affiliation: 1.Key Laboratory of Film Technology and Optical Measurement, Xi'an Technological University, No. 4 Jinhua Road, Xi'an 710032, China
   3. Comparative investigation of infrared optical absorption properties of silicon oxide, oxynitride and nitride films Zhou, Shun1, 2; Liu, Weiguo1, 2; Cai, Changlong1; Liu, Huan1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications; ISSN: 0277786X; ISBN-13: 9780819485687; DOI: 10.1117/12.888194; Article number: 79950T; Conference: 7th International Conference on Thin Film Physics and Applications, September 24, 2010 - September 27, 2010; Sponsor: Tongji University, Department of Physics; Tongji Univ., Key Lab. Adv. Microstruct. Mater., Minist. Educ.; Tongji Univ., Key Lab. Spec. Artif. Microstruct. Mater. Technol.; National Natural Science Foundation of China; Science and Technology Commission of Shanghai Municipality; Publisher: SPIE Author affiliation: 1.Shaanxi Province Thin Film Technology and Optical Test Open Key Laboratory, Xi'an Technological University, Xi'an 710032, China 2.School of Microelectronics, Xidian University, Xi'an 710071, China
   4. Analysis and simulation on error correcting performance of RS code in Chinese sensible code Yu, Xiang-Zhen1; Liu, Jun1; Wang, Qiu-Juan2 Source: Nanjing Li Gong Daxue Xuebao/Journal of Nanjing University of Science and Technology, v 35, n 1, p 42-46, February 2011; Language: Chinese; ISSN: 10059830; Publisher: Nanjing University of Science and Technology Author affiliation: 1.Department of Communication Engineering, Engineering College of Armed Police Force, Xi'an 710086, China 2.Department of Communication and Information, Xi'an Technological University, Xi'an 710032, China
   5. Optical properties and surface roughness of TiO2 thin films prepared by using oblique angle deposition Pan, Yongqiang1; Hang, Lingxia1 Source: Zhongguo Jiguang/Chinese Journal of Lasers, v 38, n 2, February 2011; Language: Chinese; ISSN: 02587025; DOI: 10.3788/CJL20113802.0207001; Article number: 0207001; Publisher: Science Press Author affiliation: 1.School of Photoelectric Engineering, Xi'an Technological University, Xi'an, Shaanxi 710032, China
   6. Research on the determination of the single gas concentration by ZnO nanowire based gas sensors Yu, Ling-Min1; Fan, Xin-Hui1; Yue, Miao1; Qi, Li-Jun1; Yan, Wen1 Source: Gongneng Cailiao/Journal of Functional Materials, v 42, n 1, p 136-138+143, January 2011; Language: Chinese; ISSN: 10019731; Publisher: Journal of Functional Materials Author affiliation: 1.School of Material and Chemical Engineering, Xi'an Technological University, Xi'an 710032, China
   7. Structural and electrical properties of PLZT (8/65/35) thin films prepared by MOD method Luo, Jianqiang1; Liu, Weiguo1; Zhou, Shun1; Sun, Xiaotao1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications; ISSN: 0277786X; ISBN-13: 9780819485687; DOI: 10.1117/12.888385; Article number: 79950G; Conference: 7th International Conference on Thin Film Physics and Applications, September 24, 2010 - September 27, 2010; Sponsor: Tongji University, Department of Physics; Tongji Univ., Key Lab. Adv. Microstruct. Mater., Minist. Educ.; Tongji Univ., Key Lab. Spec. Artif. Microstruct. Mater. Technol.; National Natural Science Foundation of China; Science and Technology Commission of Shanghai Municipality; Publisher: SPIE Author affiliation: 1.Shaanxi Province Thin Film Technology and Optical Test Open Key Laboratory, Xi'an Technological University, Xi'an 710032, China
   8. A novel shape from shading algorithm for non-Lambertian surfaces Wang, Guohui1; Liu, Shangzheng2; Han, Jiuqiang3; Zhang, Xinman3 Source: Proceedings - 3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, v 1, p 222-225, 2011, Proceedings - 3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011; ISBN-13: 9780769542966; DOI: 10.1109/ICMTMA.2011.61; Article number: 5720762; Conference: 3rd International Conference on Measuring Technology and Mechatronics Automation, ICMTMA 2011, January 6, 2011 - January 7, 2011; Sponsor: IEEE Instrumentation and Measurement Society; Shanghai University of Engineering Science; City University of Hongkong; Changsha University of Science and Technology; Hunan University of Science and Technology; Publisher: IEEE Computer Society Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China 2.Department of Electronics and Electrical Engineering, Nanyang Institute of Technology, Nanyang 473004, China 3.School of Electronics and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China
   9. Research on orthogonal experiment for CVD deposition process of SiC filament Liu, Cui-Xia1; Yang, Yan-Qing2; Xu, Ting3 Source: Gongneng Cailiao/Journal of Functional Materials, v 42, n SUPPL. 1, p 89-91, February 2011; Language: Chinese; ISSN: 10019731; Publisher: Journal of Functional Materials Author affiliation: 1.School of Materials and Chemical Engineering, Xi'an Technological University, Xi'an 710032, China 2.School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an 710072, China 3.Tubular Goods Research Institute of CNPC, Xi'an 710065, China
   10. Experiment study on laser damage characteristics of diamond-like carbon films Wu, Shenjiang1, 2; Shi, Wei1; Su, Junhong2; Xu, Junqi2; Xi, Yingxue2 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications; ISSN: 0277786X; ISBN-13: 9780819485687; DOI: 10.1117/12.888186; Article number: 799510; Conference: 7th International Conference on Thin Film Physics and Applications, September 24, 2010 - September 27, 2010; Sponsor: Tongji University, Department of Physics; Tongji Univ., Key Lab. Adv. Microstruct. Mater., Minist. Educ.; Tongji Univ., Key Lab. Spec. Artif. Microstruct. Mater. Technol.; National Natural Science Foundation of China; Science and Technology Commission of Shanghai Municipality; Publisher: SPIE Author affiliation: 1.Xi'an University of Technology, No. 5 South Jinhua Road, Xi'an 710048, China 2.Xi'an Technological University, No. 4 North Jinhua Road, Xi'an 710032, China
   11. Field emission property of printed CNTs-mixed ZnO nanoneedles Ling-Min, Yu1; Xin-Hui, Fan1; Li-Jun, Qi1; Wen, Yan1 Source: Applied Surface Science, v 257, n 15, p 6332-6335, May 15, 2011; ISSN: 01694332; DOI: 10.1016/j.apsusc.2011.01.069; Publisher: Elsevier Author affiliation: 1.School of Materials and Chemical Engineering, Xi'an Technological University, Xi'an 710032, China
   12. Study on the Web information search prediction algorithm Wang, Zhong-Sheng1; Cao, Mei1 Source: Communications in Computer and Information Science, v 143 CCIS, n PART 1, p 434-438, 2011, Advanced Research on Electronic Commerce, Web Application, and Communication - International Conference, ECWAC 2011, Proceedings; ISSN: 18650929; ISBN-13: 9783642203664; DOI: 10.1007/978-3-642-20367-1_70; Conference: International Conference on Advanced Research on Electronic Commerce, Web Application, and Communication, ECWAC 2011, April 16, 2011 - April 17, 2011; Sponsor: International Science and Education Researcher Association (ISER); VIP Information Conference Center; Publisher: Springer Verlag Author affiliation: 1.Xi'An Technological University, Xi'an 710032, China
   13. Theoretical modeling and experimental verification for structural response of NOPD based on endochronic theory Wang, Wei1; Li, Yu Yan2 Source: Applied Mechanics and Materials, v 52-54, p 800-805, 2011, Advances in Mechanical Engineering; ISSN: 16609336; ISBN-13: 9783037850770; DOI: 10.4028/www.scientific.net/AMM.52-54.800; Conference: 2011 1st International Conference on Mechanical Engineering, ICME 2011, April 3, 2011 - April 4, 2011; Sponsor: International Industrial Electronics Center; Shenzhen University; ACM Hong Kong Chapter; Publisher: Trans Tech Publications Author affiliation: 1.Space Optics Laboratory, Xi'an Institute of Optics and Precision Mechanics, CAS, Xi'an, 710119, China 2.Department of Mechanical and Electrical Engineering, Xi'an Technological University, Xi'an, 710032, China
   14. CNT promoted preparation and catalytic properties of CuCo-based catalysts for high-alcohol synthesis Shi, Li-Min1; Chu, Wei2; Deng, Si-Yu2 Source: Gongneng Cailiao/Journal of Functional Materials, v 42, n 2, p 237-240, February 2011; Language: Chinese; ISSN: 10019731; Publisher: Journal of Functional Materials Author affiliation: 1.School of Materials and Chemical Engineering, Xi'an Technological University, Xi'an 710032, China 2.School of Chemical Engineering, Sichuan University, Chengdu 610065, China
   15. Simultaneous quantitative analysis of arsenic, bismuth, selenium, and tellurium in soil samples using multi-channel hydride-generation atomic fluorescence spectrometry Fang, Wang1; Gai, Zhang2 Source: Applied Spectroscopy, v 65, n 3, p 315-319, March 2011; ISSN: 00037028; DOI: 10.1366/10-06048; Publisher: Society for Applied Spectroscopy Author affiliation: 1.Department of Chemistry and Chemical Engineering, Shaanxi Institute of Education, Xi'an 710061, China 2.School of Materials and Chemical Engineering, Xi'an Technological University, Xi'an 710032, China
   16. Research on tension control technology based on fuzzy control algorithm Ru, Feng1; Ru, Yuan2; Hu, Fei-Hu3 Source: Dianji yu Kongzhi Xuebao/Electric Machines and Control, v 15, n 2, p 89-93, February 2011; Language: Chinese; ISSN: 1007449X; Publisher: Editorial Department of Electric Machines and Control Author affiliation: 1.School of Electronic and Control Engineering, Chang'an University, Xi'an 710064, China 2.School of Computer Science and Engineering, Xi'an Technological University, Xi'an 710032, China 3.School of Electrical Engineering, Xi'an Jiaotong University, Xi'an 710049, China
   17. Microstructure and texture evolution of cold drawing ?110 single crystal copper Chen, Jian1, 2; Yan, Wen1, 2; Li, Bing2; Ma, XiaoGuang2; Du, XinZhi2; Fan, XinHui2 Source: Science China Technological Sciences, p 1-9, 2011; ISSN: 16747321, E-ISSN: 1862281X; DOI: 10.1007/s11431-011-4349-5 Author affiliation: 1.Department of Applied Physics, Northwestern Polytechical University, Xi'an, 710072, China 2.School of Materials Science and Chemical Engineering, Xi'an Technological University, Xi'an, 710032, China
   18. Polymer films as planarization and sacrificial layers for uncooled infrared focal plane arrays Liu, Huan1; Liu, Weiguo1; Cai, Changlong1; Zhou, Shun1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications; ISSN: 0277786X; ISBN-13: 9780819485687; DOI: 10.1117/12.888597; Article number: 79952X; Conference: 7th International Conference on Thin Film Physics and Applications, September 24, 2010 - September 27, 2010; Sponsor: Tongji University, Department of Physics; Tongji Univ., Key Lab. Adv. Microstruct. Mater., Minist. Educ.; Tongji Univ., Key Lab. Spec. Artif. Microstruct. Mater. Technol.; National Natural Science Foundation of China; Science and Technology Commission of Shanghai Municipality; Publisher: SPIE Author affiliation: 1.Shaanxi Province Key Lab. Of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710032, China
   19. Effects of samarium on microstructures and tensile properties of Mg-5Al-0.3Mn alloy Wang, Jianli1; Wang, Lidong2; Wu, Yaoming2; Wang, Limin2 Source: Materials Science and Engineering A, v 528, n 12, p 4115-4119, 15 May 2011; ISSN: 09215093; DOI: 10.1016/j.msea.2011.01.109; Publisher: Elsevier Ltd Author affiliation: 1.School of Materials and Chemical Engineering, Xi'an Technological University, Xi'an 710032, China 2.State Key Laboratory of Rare Earth Resource Utilization, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 130022, China
   20. Effects of plasma nitriding and TiN coating duplex treatment on wear resistance of commercially pure titanium Tong, Yu1, 2; Guo, Tian-Wen1; Wang, Jing1; Liang, Hai-Feng3; Mi, Qian3 Source: Advanced Materials Research, v 217-218, p 1050-1055, 2011, High Performance Structures and Materials Engineering; ISSN: 10226680; ISBN-13: 9783037850756; DOI: 10.4028/www.scientific.net/AMR.217-218.1050; Conference: 2011 1st International Conference on High Performance Structures and Materials Engineering, ICHPSM 2011, May 5, 2011 - May 6, 2011; Sponsor: International Industrial Electronics Center; Shenzhen University; ACM Hong Kong Chapter; Publisher: Trans Tech Publications Author affiliation: 1.Department of Prosthodontics, School of Stomatology, Fourth Military Medical University, Xi'an, China 2.Department of Stomatology, Hangzhou Aeromedicine Evaluation and Training Center of the Air Force, Hangzhou, China 3.Shaanxi Province Key Laboratory of Thin Film Technology and Optical Detection, Xi'an Technological University, Xi'an, China
   21. Parameter identification for nonlinear dry-friction structure of metallic rubber Li, Yu Yan1; Huang, Xie Qing2; Song, Kai2 Source: Applied Mechanics and Materials, v 52-54, p 494-499, 2011, Advances in Mechanical Engineering; ISSN: 16609336; ISBN-13: 9783037850770; DOI: 10.4028/www.scientific.net/AMM.52-54.494; Conference: 2011 1st International Conference on Mechanical Engineering, ICME 2011, April 3, 2011 - April 4, 2011; Sponsor: International Industrial Electronics Center; Shenzhen University; ACM Hong Kong Chapter; Publisher: Trans Tech Publications Author affiliation: 1.Department of Mechanical and Electrical Engineering, Xi'an Technological University, Xi'an, 710032, China 2.School of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, 710049, China
   22. Study of TCR of TiW alloy films deposited by magnetron sputtering Cai, Changlong1; Zhai, Yujia1; Zhou, Shun1; Liu, Huan1; Huang, Jing1; Liu, Weiguo1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7995, 2011, Seventh International Conference on Thin Film Physics and Applications; ISSN: 0277786X; ISBN-13: 9780819485687; DOI: 10.1117/12.888281; Article number: 799506; Conference: 7th International Conference on Thin Film Physics and Applications, September 24, 2010 - September 27, 2010; Sponsor: Tongji University, Department of Physics; Tongji Univ., Key Lab. Adv. Microstruct. Mater., Minist. Educ.; Tongji Univ., Key Lab. Spec. Artif. Microstruct. Mater. Technol.; National Natural Science Foundation of China; Science and Technology Commission of Shanghai Municipality; Publisher: SPIE Author affiliation: 1.Micro-Optoelectrical System Laboratory, Xi'an Technological University, Xi'an 710032, China

此次学科建设服务部检索EI使用的是学校现在和以前的英文规范名称,即Xi’an technological university和Xi’an institute of technology。如本校教师因使用其他英文名称而与此检索结果有所出入,请见谅。请及时与我部联系。



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