2010年12(1)月EI收录西安工业大学论文名录

   1.Energy-to-peak filtering for discrete-time singular systems via normal transformation
Jia, Peigang1; Wang, Ping2; Yan, Maode2 Source: Proceedings of 2010 International Conference on Intelligent Control and Information Processing, ICICIP 2010, n PART 2, p 64-68, 2010, Proceedings of 2010 International Conference on Intelligent Control and Information Processing, ICICIP 2010; ISBN-13: 9781424470488; DOI: 10.1109/ICICIP.2010.5565280; Article number: 5565280; Conference: 2010 International Conference on Intelligent Control and Information Processing, ICICIP 2010, August 13, 2010 - August 15, 2010; Sponsor: Dalian University of Technology; Publisher: IEEE Computer Society Author affiliation: 1. Department of Machinery Manufacture, Xi'an Technological University, Xi'an, China 2. Department of Automation, Chang'an University, Xi'an, China
   2.Effect of loaded area on constitutive relation of metal-rubber
Li, Yuyan1; Huang, Xieqing2 Source: Zhendong Ceshi Yu Zhenduan/Journal of Vibration, Measurement and Diagnosis, v 30, n 5, p 544-546, October 2010; Language: Chinese; ISSN: 10046801; Publisher: Nanjing University of Aeronautics an Astronautics Author affiliation: 1.Department of Mechanical and Electrical Engineering, Xi'an Technological University, Xi'an, 710032, China 2.Department of Mechanical Engineering, Xi'an Jiaotong University, Xi'an, 710049, China
   3.Research on the distribution of electric field intensity and laser damage characteristics of thin films
Li, Yuan1; Xu, Jun-Qi1; Su, Jun-Hong1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.865738; Article number: 76564L; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710032, China
   4.Influence of ion beam bombardment on surface roughness of K9 glass substrate
Pan, Yongqiang1; Huang, Guojun1; Hang, Lingxia1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7655, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; ISSN: 0277786X; ISBN-13: 9780819480859; DOI: 10.1117/12.866134; Article number: 76551G; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.Shaanxi Province Thin Film Technology and Optical Test Open Key Laboratory, Xi'an Technological University, Xi'an, 710032, China
   5.Study on a new method to measure objects polarization information
Lu, Shaojun1; Han, Jun1; Duan, Cunli1; Guo, Rongli1; Zhang, Weiguang1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.866614; Article number: 76564P; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an, Shanxi, 710032, China
   6.Study on inner hole testing of nozzle with small size and complex contour
Zhang, Liang1; Su, Jun-Hong1; Yang, Li-Hong1; Xu, Jun-Qi1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.865535; Article number: 76564N; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an, Shaanxi, 710032, China
   7.Identification and quantification of non-commonpath error in lateral shearing interferometry
Liu, Bingcai1; Tian, Ailing1; Wang, Hongjun1; Wang, Chunhui1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.865729; Article number: 76560H; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an, 710032, China
   8.Test of film thickness based on annular sub-aperture stitching interference
Yang, Li-Hong1, 2; Su, Jun-Hong1; Chen, Zhi-Li1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.866735; Article number: 765661; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China 2.Faculty of Automation and Information Engineering, Xi'an University of Technology, Xi'an, 710048, China
   9.Design of compact UWB power divider with one narrow notch-band
Wei, F.1; Chen, L.2; Shi, X.-W.1; Wu, Q.-Y.1; Huang, Q.-L.1 Source: Journal of Electromagnetic Waves and Applications, v 24, n 17-18, p 2343-2352, December 1, 2010; ISSN: 09205071, E-ISSN: 15693937; DOI: 10.1163/156939310793675637; Publisher: VSP BV Author affiliation: 1.National Key Laboratory of Science and Technology on Antennas and Microwaves, Xidian University, Xi'an 710071, China 2.Electronic and Information Engineering School, Xi'An Technological University, Xi'an 710032, China
   10.Unknown input observer based fault class isolation and estimation
Wang, Zhi1 Source: Proceedings of the 29th Chinese Control Conference, CCC'10, p 3963-3968, 2010, Proceedings of the 29th Chinese Control Conference, CCC'10; ISBN-13: 9787894631046; Article number: 5572954; Conference: 29th Chinese Control Conference, CCC'10, July 29, 2010 - July 31, 2010; Sponsor: IEEE Control Systems Society (CSS); The ICROS OF Korea; IEEE CSS Singapore Chapter; IEEE CSS Hong Kong Chapter; IEEE CSS Beijing Chapter; Publisher: IEEE Computer Society Author affiliation: 1.Computer Science and Engineering College, Xi'an Technological University, Xian, 710032, China
   11.Research on knowledge management of collaborative design
Chu, Miao1, 2; Tian, Shaohui3 Source: Proceedings of the International Conference on E-Business and E-Government, ICEE 2010, p 1890-1893, 2010, Proceedings of the International Conference on E-Business and E-Government, ICEE 2010; ISBN-13: 9780769539973; DOI: 10.1109/ICEE.2010.478; Article number: 5592777; Conference: 1st International Conference on E-Business and E-Government, ICEE 2010, May 7, 2010 - May 9, 2010; Sponsor: South China University of Technology; Publisher: IEEE Computer Society Author affiliation: 1.Institute of Industry Design, Mechatronics Department, Northwestern Polytechnical University, Xi'an, Shaanxi Province 710072, China 2.College of Art and Communications, Xi'an Technology University, Xi'an, Shaanxi Province 710032, China 3.Research Office of Chemical Materials Application, Architectural Engineering Institute, General Logistics Department, Xi'an, Shaanxi Province 710032, China
   12.Study on a novel algorism of phase unwrapping for interferogram processing
Su, Jun-Hong1; Wan, Wen-Bo1; Yang, Li-Hong1; Xu, Jun-Qi1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.865352; Article number: 765670; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronics Engineering, Xi'an Technological University, Xi'an, 710032, China
   13.Corrosion resistance of micro-arc oxidized ceramic coating on cast hypereutectic alloy
Guo, Qiao-Qin1, 2; Jiang, Bai-Ling1; Li, Jian-Ping2; Li, Gao-Hong2; Xia, Feng2 Source: Transactions of Nonferrous Metals Society of China (English Edition), v 20, n 11, p 2204-2207, November 2010; ISSN: 10036326; DOI: 10.1016/S1003-6326(09)60443-X; Publisher: Nonferrous Metals Society of China Author affiliation: 1.Institute of Materials Science and Technology, Xi'An University of Technology, Xi'an 710048, China 2.School of Materials and Chemical Engineering, Xi'An Technological University, Xi'an 710032, China
   14.Microwave dielectric properties of low-firing Li2MO3 (M=Ti, Zr, Sn) ceramics with B2O3-CuO addition
Pang, Li-Xia1; Zhou, Di2 Source: Journal of the American Ceramic Society, v 93, n 11, p 3614-3617, November 2010; ISSN: 00027820, E-ISSN: 15512916; DOI: 10.1111/j.1551-2916.2010.04152.x; Publisher: Blackwell Publishing Inc. Author affiliation: 1.Laboratory of Thin Film Techniques and Optical Test, Xi'An Technological University, Xi'an 710032, China 2.Electronic Materials Research Laboratory, Xi'An Jiaotong University, Ministry of Education, Xi'an 710049, China
   15.Improved zone-plate interferometer for measuring aspheric surface
Nie, Liang1; Wang, Gang1; Quan, Guiqin1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.866157; Article number: 76566C; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronics Engineering, Xi'an Technological University, Xi'an, 710032, China
   16.Study on the relationship between deflection angle and scanning angular of optical scanner
Sun, Guobin1; Mi, Qian1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.865921; Article number: 765660; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an, 710032, China
   17.Research on evaluation system of science and technology works of local universities
Su, Junhong1; Li, Gaohong1; Yu, Xiaoning1; Peng, Yuli1; Guo, Juncang1 Source: Wuhan Daxue Xuebao (Xinxi Kexue Ban)/Geomatics and Information Science of Wuhan University, v 35, n SPECIAL ISSUE 1, p 118-122, November 2010; ISSN: 16718860; Publisher: Wuhan University Author affiliation: 1.Scientific Technology Department, Xi'an Technological University, Xi'an 710032, China
   18.Novel method to examine phase object by the use of TFT-LCD
Guo, Rongli1, 2, 3; Yao, Baoli2; Han, Jun1; Yu, Xun1; Nie, Liang1; Duan, Cunli1; Wang, Fan4 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.866452; Article number: 76563D; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China 2.State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China 3.Graduate School of the Chinese Academy of Sciences, Beijing 100049, China 4.School of Optoelectronic, Beijing Institute of Technology, Beijing 100081, China
   19.Research of combination polishing technology
Hang, Liangxia1; Zhu, Xueliang1; Liu, Weiguo1; Guo, Zhongda1; Chen, Zhili1; Wang, Hongjun1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7655, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; ISSN: 0277786X; ISBN-13: 9780819480859; DOI: 10.1117/12.866698; Article number: 76552R; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.Shaanxi Province Key Laboratory of Thin Films Technology and Optical Test, Xi'an Technological University, Xi'an 710032, China
   20.Interference of convergent polarized light to test crystal optical surface
Duan, Cun-Li1; Zhang, Su-Juan2; Hu, Xiao-Ying1; Lu, Shao-Jun1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.866739; Article number: 765626; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.Institute of Photoelectric Engineering, Xi'an Technological University, Xi'an, Shanxi 710032, China 2.Photon and Photonics Research Institute, Northwestern University, Xi'an, Shanxi 710069,china
China
   21.Research of the Honeynet log based on the IDA analyzer
Bai, Wan-Min1; Wang, Zhong-Sheng1 Source: ICCASM 2010 - 2010 International Conference on Computer Application and System Modeling, Proceedings, v 7, p v7468-v7470, 2010, ICCASM 2010 - 2010 International Conference on Computer Application and System Modeling, Proceedings; ISBN-13: 9781424472369; DOI: 10.1109/ICCASM.2010.5619106; Article number: 5619106; Conference: 2010 International Conference on Computer Application and System Modeling, ICCASM 2010, October 22, 2010 - October 24, 2010; Sponsor: Shanxi University; Taiyuan University of Technology; Taiyuan University of Science and Technology; Shanxi Normal University; Publisher: IEEE Computer Society Author affiliation: 1.Xi'an Technological University, Xi'an, 710032, China
   22.Growth process and corrosion resistance of micro-arc oxidation coating on Mg-Zn-Gd magnesium alloys
Wang, Ping1, 2; Liu, Dao-Xin1; Li, Jian-Ping2; Guo, Yong-Chun2; Yang, Zhong2 Source: Transactions of Nonferrous Metals Society of China (English Edition), v 20, n 11, p 2198-2203, November 2010; ISSN: 10036326; DOI: 10.1016/S1003-6326(09)60442-8; Publisher: Nonferrous Metals Society of China Author affiliation: 1.Aeronautical Institute, Northwestern Polytechnical University, Xi'an 710072, China 2.School of Materials and Chemical Engineering, Xi'an Technological University, Xi'an 710032, China
   23.Analysis of closed fringe patterns for aspheric surface measurement
Nie, Liang1; Liu, Baoyuan1; Han, Jun1; Yu, Xun1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.866158; Article number: 76565K; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronics Engineering, Xi'an Technological University, Xi'an, 710032, China
   24.A model for cooperative design based on multi-agent system
Chen, Hua1; Zhao, Jun1; Sun, Bo1 Source: Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), v 6319 LNAI, n PART 1, p 349-356, 2010, Artificial Intelligence and Computational Intelligence - International Conference, AICI 2010, Proceedings; ISSN: 03029743, E-ISSN: 16113349; ISBN-10: 364216529X, ISBN-13: 9783642165290; DOI: 10.1007/978-3-642-16530-6_41; Conference: 2010 International Conference on Artificial Intelligence and Computational Intelligence, AICI 2010, October 23, 2010 - October 24, 2010; Sponsor: Hainan Province Institute of Computer; Qiongzhou University; Publisher: Springer Verlag Author affiliation: 1.Institute of Mechanical and Electrical Engineer, Xi'an Technological University, 710032 Xi'an, China
   25.Design for N+1 fault-tolerant integrated solar controller
Huang, Dingjin1; Fei, Han1; Li, Liang1; Zhu, Yunzhou1 Source: 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, v 6, p 151-154, 2010, 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010; ISBN-13: 9781424479566; DOI: 10.1109/CMCE.2010.5609900; Article number: 5609900; Conference: 2010 International Conference on Computer, Mechatronics, Control and Electronic Engineering, CMCE 2010, August 24, 2010 - August 26, 2010; Sponsor: IEEE Industrial Electronics Society Beijing (Shenzhen) Chapter; Changchun University of Technology; Intelligent Inf. Technol. Appl. Res. Assoc. (IITA Assoc.); Publisher: IEEE Computer Society Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China
   26.e-MAC: A high throughput MAC protocol for ad hoc networks
Zhang, Ke-Wang1; Pan, Yu1, 2; Zhang, Qiong3; Zhang, De-Yun1 Source: Ruan Jian Xue Bao/Journal of Software, v 21, n 10, p 2666-2676, October 2010; Language: Chinese; ISSN: 10009825; DOI: 10.3724/SP.J.1001.2010.03674; Publisher: Chinese Academy of Sciences Author affiliation: 1.School of Electronic and Information, Xi'an Jiaotong University, Xi'an 710049, China 2.School of Computer Science, Xi'an Technological University, Xi'an 710032, China 3.School of Computer Science, Xi'an University of Posts and Communications, Xi'an 710061, China    27.Experimental investigation on Erbium-doped fiber source in double-pass forward configuration
Wu, Xu1; Liu, Cheng-Xiang2; Zhang, Li3; Fang, Hong1; Ruan, Shuang-Chen2 Source: Zhongguo Guanxing Jishu Xuebao/Journal of Chinese Inertial Technology, v 18, n 1, p 106-110, February 2010; Language: Chinese; ISSN: 10056734; Publisher: Editorial Department of Journal of Chinese Inertial Technolo Author affiliation: 1.Department of Mathematics and Physics, Xi'an Technological University, Xi'an 710032, China 2.Shenzhen Key Laboratory of Laser Engineering, College of Electronic Science and Technology, Shenzhen University, Shenzhen 518060, China 3.College of Information Engineering, Shenzhen University, Shenzhen 518060, China
   28.Dependence of morphologies for SnO2 nanostructures on their sensing property
Lingmin, Yu1; Xinhui, Fan1; Lijun, Qi1; Lihe, Ma1; Wen, Yan1Source: Applied Surface Science, 2010; ISSN: 01694332; DOI: 10.1016/j.apsusc.2010.11.013 Author affiliation: 1.School of Material and Engineering, Xi'an Technological University, Xi'an Jin Hua Road No. 4, 710032, China
   29.Study on energy control system of film damage threshold testing by LabVIEW
Su, Jun-Hong1; Cheng, Chun-Juan1; Xu, Jun-Qi1; Yang, Li-Hong1; Liu, Bao-Yuan1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.865543; Article number: 76564Z; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.Xi'an Technological University, College of Optoelectronic Engineering, Xi'an, 710032, China
   30.Raman spectra of amorphous carbon films deposited by SWP
Xu, Junqi1, 2; Liu, Weiguo1; Hang, Lingxia1; Su, Junhong1; Fan, Huiqing2 Surce: Proceedings of SPIE - The International Society for Optical Engineering, v 7655, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; ISSN: 0277786X; ISBN-13: 9780819480859; DOI: 10.1117/12.865536; Article number: 76552L; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Opto-electronic Engineering, Xi'an Technological University, Xi'an, 710032, China 2.State Key Laboratory of Solidification Processing, School of Materials Science and Engineering, Northwestern Polytechnical University, Xi'an, 710072, China
   31.Compound control system design based on hierarchical sliding mode and ADRC techniques for low speed spinning ballistic missile
Wang, Zhi1 Source: Proceedings of the 29th Chinese Control Conference, CCC'10, p 3468-3473, 2010, Proceedings of the 29th Chinese Control Conference, CCC'10; ISBN-13: 9787894631046; Article number: 5573194; Conference: 29th Chinese Control Conference, CCC'10, July 29, 2010 - July 31, 2010; Sponsor: IEEE Control Systems Society (CSS); The ICROS OF Korea; IEEE CSS Singapore Chapter; IEEE CSS Hong Kong Chapter; IEEE CSS Beijing Chapter; Publisher: IEEE Computer Society Author affiliation: 1.Computer Science and Engineering College, Xi'an Technological University, Xian 710032, China
   32.3D object retrieval based on Bayesian networks lightfield descriptor and feedback learning
Xiao, Qinkun1; Wang, Haiyun1; Hu, Xiaoxia1; Li, Fei2; Gao, Yue2 Source: 2010 IEEE International Conference on Mechatronics and Automation, ICMA 2010, p 1669-1674, 2010, 2010 IEEE International Conference on Mechatronics and Automation, ICMA 2010; ISBN-13: 9781424451418; DOI: 10.1109/ICMA.2010.5588863; Article number: 5588863; Conference: 2010 IEEE International Conference on Mechatronics and Automation, ICMA 2010, August 4, 2010 - August 7, 2010; Sponsor: IEEE Robotics and Automaton Society; Xidian University; University of Alberta; Kagawa University; Publisher: IEEE Computer Society Author affiliation: 1.Xi'an Technological University, Xi'an, 710032, China 2.Tsinghua University, Beijing, 100084, China
   33.Novel sub-pixel feature point extracting algorithm for three-dimensional measurement system with linear-structure light
Zhang, Weiguang1, 2; Cao, Nan2; Guo, Haiyan3 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.864563; Article number: 76563V; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an, 710032, China 2.State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China 3.Jiyuan Power Supply Company, Jiyuan, Henan Province, 454650, China
   34.Diffraction wavefront analysis of point diffraction interferometer for measurement of aspherical surface
Gao, Fen1, 2; Jiang, Zhuang-De1; Li, Bing1 Source: Proceedings of SPIE - The International Society for Optical Engineering, v 7656, n PART 1, 2010, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; ISSN: 0277786X; ISBN-13: 9780819480866; DOI: 10.1117/12.867049; Article number: 76565Y; Conference: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, April 26, 2010 - April 29, 2010; Sponsor: The Chinese Optical Society (COS); CAS, The Institute of Optics and Electronics (IOE); The Society of Photo-Optical Instrumentation Engineers (SPIE); Publisher: SPIE Author affiliation: 1.State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049, China 2.School of Optoelectronic Engineering, Xi'an Technological University, Xi'an 710032, China
   35.Ferroelastic phase transition compositional dependence for solid-solution [(Li0.5Bi0.5) x Bi1- x ][Mo x V1- x ]O4 scheelite-structured microwave dielectric ceramics
Zhou, D.1, 2; Qu, W.G.2; Randall, C.A.2; Pang, L.X.3; Wang, H.1; Wu, X.G.1; Guo, J.1; Zhang, G.Q.1; Shui, L.1; Wang, Q.P.1, 4; Liu, H.C.4; Yao, X.1 Source: Acta Materialia, 2010; ISSN: 13596454; DOI: 10.1016/j.actamat.2010.11.014 Author affiliation: 1.Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education, Xi'an Jiaotong University, Xi'an 710049, Shaanxi, China 2.Center for Dielectric Studies, Materials Research Institute, The Pennsylvania State University, University Park, PA 16802, USA 3.Micro-optoelectronic Systems Laboratories, Xi'an Technological University, Xi'an 710032, Shaanxi, China 4.School of Science, Xi'an Polytechnic University, Xi'an 710048, China
   36.The modeling of tension control system in optical fiber automatic winding
Ma, Baoji1; Dong, Sun1 Source: 2010 International Conference on Mechanic Automation and Control Engineering, MACE2010, p 2231-2234, 2010, 2010 International Conference on Mechanic Automation and Control Engineering, MACE2010; ISBN-13: 9781424477388; DOI: 10.1109/MACE.2010.5536218; Article number: 5536218; Conference: 2010 International Conference on Mechanic Automation and Control Engineering, MACE2010, June 26, 2010 - June 28, 2010; Sponsor: IEEE Beijing Section CSS Chapter; Huazhong University of Science and Technology; Wuhan University of Science and Technology; Publisher: IEEE Computer Society Author affiliation: 1.Xi'an Technological University, Xi'an Technological University, XATU, Xi'an, China
   37.Parameterized algebraical construction method of biorthogonal wavelet
Zhu, Qiang1; Chen, Xiaodong1; Wang, Hongxi2; Li, Ping1 Source: Proceedings - 2010 3rd IEEE International Conference on Computer Science and Information Technology, ICCSIT 2010, v 8, p 44-48, 2010, Proceedings - 2010 3rd IEEE International Conference on Computer Science and Information Technology, ICCSIT 2010; ISBN-13: 9781424455386; DOI: 10.1109/ICCSIT.2010.5565026; Article number: 5565026; Conference: 2010 3rd IEEE International Conference on Computer Science and Information Technology, ICCSIT 2010, July 9, 2010 - July 11, 2010; Publisher: IEEE Computer Society Author affiliation: 1.Institute of Measurement and Control Technology, Xi'an Technological University, Xi'an, China 2.Mechanical and Electrical Engineering Institute, Xi'an Technological University, Xi'an, China
   38.Design for communications center monitor & control system
Lv, Zhigang1; Liu, Cuixia2 Source: ICEIT 2010 - 2010 International Conference on Educational and Information Technology, Proceedings, v 1, p V1443-V1445, 2010, ICEIT 2010 - 2010 International Conference on Educational and Information Technology, Proceedings; ISBN-13: 9781424480340; DOI: 10.1109/ICEIT.2010.5607666; Article number: 5607666; Conference: 2010 International Conference on Educational and Information Technology, ICEIT 2010, September 17, 2010 - September 19, 2010; Sponsor: Int. Assoc. Comput. Sci. Inf. Technol. (IACSIT); Publisher: IEEE Computer Society Author affiliation: 1.School of Electronics and Information Engineering, Xi'an Technological University, Xi'an City, China 2.School of Materials and Chemical Engineering, Xi'an Technological University, Xi'an City, China
   39.Generation algorithm of direction-parallel tool path based on image processing
Jin, Xiaoli1; Li, Yutian1 Source: 2010 International Conference on Mechanic Automation and Control Engineering, MACE2010, p 600-603, 2010, 2010 International Conference on Mechanic Automation and Control Engineering, MACE2010; ISBN-13: 9781424477388; DOI: 10.1109/MACE.2010.5536578; Article number: 5536578; Conference: 2010 International Conference on Mechanic Automation and Control Engineering, MACE2010, June 26, 2010 - June 28, 2010; Sponsor: IEEE Beijing Section CSS Chapter; Huazhong University of Science and Technology; Wuhan University of Science and Technology; Publisher: IEEE Computer Society Author affiliation: 1.Xi' an Technological University, Xi' an Technological University, XATU, Xi' an, China
   40.Research of dynamic scheduling method for the air-to-ground warfare simulation system based on grid
Fu, Yanfang1; Kang, Fengju2; Qi, Jianghua3; Duan, Shimei4 Source: Simulation Modelling Practice and Theory, v 18, n 8, p 1116-1129, 2010; ISSN: 1569190X; DOI: 10.1016/j.simpat.2010.01.006; Publisher: Elsevier Author affiliation: 1.Computer Science and Engineering College, Xi'An Technological University, Xi'an, Shaanxi Province, China 2. Collage of Marine, Northwestern Polytechnical University, Xi'an, Shaanxi Province, China 3. Xi'An Technological University, Shaanxi Province, China 4. China Flight Test Establishment, Shaanxi Province, China
   41.The study on risk factors associated with information system project performance from knowledge resources view
Hong, Kang1 Source: 2010 International Conference on Networking and Digital Society, ICNDS 2010, v 1, p 444-446, 2010, 2010 International Conference on Networking and Digital Society, ICNDS 2010; ISBN-13: 9781424451616; DOI: 10.1109/ICNDS.2010.5479231; Article number: 5479231; Conference: 2nd International Conference on Networking and Digital Society, lCNDS 2010, May 30, 2010 - May 31, 2010; Publisher: IEEE Computer Society Author affiliation: 1. Management and Economy School, Xi'an Technological University, Xi'an, China 1. Management and Economy School, Xi'an Technological University, Xi'an, China

此次学科建设服务部检索EI使用的是学校现在和以前的英文规范名称，即Xi’an technological university和Xi’an institute of technology。如本校教师因使用其他英文名称而与此检索结果有所出入，请见谅。请及时与我部联系。